PARIS VA Output IEPD

Master Documentation Files

• Testing and Conformance: ConTesa
• Subset Schema: NIEM Core
• Business Requirements: VAOutput IEPD business requirements
• Sample XML Instance: Reply sample
• Methodology and Tools: Eclipse NIEM di
• Subset Schema: FBI
• Exchange Schema: Exchange
• Methodology and Tools: Eclipse NIME MPD catalog
• Subset Schema: Proxy
• NIEM Mapping: NIEM Mapping
• Methodology and Tools: Eclipse NIEM UML
• Subset Schema: appinfo 2.0
• Subset Schema: Structures
• Domain Model: UML model
• Extension Schema: Extension
• Methodology and Tools: Eclipse NIEM notation
• Sample XML Instance: Send sample
• Change Log: Eclipse NIEM change log
• Subset Schema: appinfo 2.1
• Business Requirements: VA Output record layout

Catalog Files

• Catalog: catalog.html
• Metadata: metadata.xml